TY  - JOUR
Salvatore M. Amoroso; Plamen Asenov; Jaehyun Lee; Nara Kim; Ko-Hsin Lee; Yaohua Tan; Yong-Seog Oh; Lee Smith; Xi-Wei Lin; Victor MorozT1  - Enabling Variability-Aware Design-Technology Co-Optimization for Advanced Memory Technologies
JO  - Journal of Microelectronic Manufacturing
VL  - 3
Y1  - 2020/12/30
UR  - http://www.jommpublish.org/p/55/60/
L1  - http://www.jommpublish.org/jomm_data/publish/B3/9C/3F/38554E4064901D51688C223A71/10.33079.jomm.20030409.pdf
DO  - 10.33079/jomm.20030409
ER  -