TY  - JOUR
Avirup Dasgupta; Chenming HuT1  - BSIM-CMG compact model for IC CAD: from FinFET to Gate-All-Around FET Technology
JO  - Journal of Microelectronic Manufacturing
VL  - 3
Y1  - 2020/12/30
UR  - http://www.jommpublish.org/p/183/59/
L1  - http://www.jommpublish.org/jomm_data/publish/C2/6E/D7/F004AD421DB419CAD0B8D1BB53/10.33079.jomm.20030402.pdf
DO  - 10.33079/jomm.20030402
ER  -